Re: Sio & Puc memory mapped

From: Roman Kurakin <rik_at_cronyx.ru>
Date: Fri, 14 May 2004 22:51:51 +0400
Marcel Moolenaar wrote:

>On Fri, May 14, 2004 at 07:16:27PM +0400, Roman Kurakin wrote:
>
>*snip*
>  
>
>>I don't have any other cards supported by uart(4), so I can't test
>>it by my self. If you have a time and ability, I'll send these tests
>>for you.
>>    
>>
>Love to. I can take a look at it this weekend. If the tests aren't
>self-explanatory, could you add a small note about what they are
>supposed to test and if not obvious, what their expected outcome is?
>  
>
If you get an error or test freeze this would be bad.
The only problem that could be - "break test" should fail.
Other tests should pass.

I doesn't use break test, so I put off to find out why this part
is broken.

Usage:
        aiotest [-spmfb] device1 device2
Options:
        -s      speed test
        -p      parity test
        -m      pmodem signals test
        -f      flow control test
        -b      break test

This test tests two ports. You need a full null-mode cable for it.

Usage:
        asytest [-b baud] [-p pattern] device...
Options:
        -b #    data rate, default 115200 bits/sec
        -p [12] pattern, default 1
                 1 0xAA/0x55
                 2 random

This is single port test. You need a loop for it. You may run two tests
for two connected to each other ports, but in that case I would unable
to use random pattern. On linux 2.6 serial driver test with constant
pattern works almost fine, but with random shows how it is buggy.

rik
Received on Fri May 14 2004 - 09:55:46 UTC

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